Analysis of the electrical double layer using electrochemical X-ray photoelectron spectroscopy

The element-sensitivity of X-ray spectroscopies offers the potential to disentangle the individual chemistries of water, ions, and adsorbates at the electrode-electrolyte interface in an element-by-element manner. However, targeted experimental design is needed to establish interface-sensitive in situ X-ray spectroscopy in a realistic electrochemical environment. Here, we demonstrate how electrochemical X-ray photoelectron spectroscopy (EC-XPS) in the dip-and-pull geometry can be used to specifically probe the behavior of ions in the electrical double layer. Taking the case study of a polycrystalline Au foil in 50 mM KClO 4 electrolyte, we tracked the electrochemical response of interfacial K + cations across a broad potential range. We show how, in combination with modeling, key parameters such as the potential of zero charge (PZC), ion packing behavior, dielectric saturation, and the electrostatic potential decay in the double layer can be extracted from the data. Importantly, we also analyze how the experimental conditions and non-idealities can influence the results and put forward criteria for reliable experimentation and data analysis.