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◆ Sensors (Basel, Switzerland)2026-09-05

Dual X-Ray and Optical System for In Situ Monitoring of Solids Fraction in Tailings.

Talwinder Kaur Sraw, Bo Yu, Xiaoxuan Liu, Jason Ng, Andrea Sedgwick, Manisha Gupta, Robert Fedosejevs, Ying Yin Tsui

原始摘要(英文原文)· Original abstract
A sensing apparatus was developed to quantify solids fraction within a 3 m test column, demonstrating real-time monitoring of tailings sedimentation. This integrated system employs a low-power infrared laser coupled with scattering detectors alongside a low-activity radioactive source and detector. Both methodologies utilize non-destructive principles to evaluate the concentration of solids. Specifically, X-ray transmission through the medium provides a measure of the solids fraction, as X-ray attenuation corresponds to the solids percentage. Concurrently, the optical component detects radiation backscatter from the sample. To ensure precision, both instruments underwent calibration using reference materials. Experimental evaluations were conducted using two configurations: a fixed array and a depth-profiling setup. The former utilized a 2.5 m plastic column with integrated sensors placed within a settling vessel to acquire data at discrete depths. Conversely, the depth-profiling configuration involved a submersible mobile unit lowered into the column to characterize the solids profile at arbitrary depths.
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Dual X-Ray and Optical System for In Situ Monitoring of Solids Fraction in Tailings. — 科研速览 Science Skim