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◆ Modern Journal of Statistics2025-11-06· Reliability (semiconductor)

Obulezi distribution: a novel one-parameter distribution for lifetime data modeling

Okechukwu J. Obulezi

原始摘要(英文原文)· Original abstract
This paper introduces the novel, single-parameter Obulezi distribution for modeling lifetime data. We derived its statistical and reliability properties and performed an exhaustive comparison of fifteen parameter estimation techniques via simulation and application to three real datasets. Simulation results confirmed the consistency of all estimators, while empirical analysis showed the Obulezi distribution consistently yielded the lowest standard errors, proving it to be the most precise and stable model compared to competitors. Goodness-of-fit metrics confirmed the \texttt{Obulezi} distribution's superior fit, particularly for data exhibiting an increasing hazard rate. The Obulezi distribution is thus a robust and highly competitive model for parsimonious survival and reliability analysis.
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