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◆ Sensors2025-12-11· Subpixel rendering

A Multi-Parameter Inspection Platform for Transparent Packaging Containers: System Design for Stress, Dimensional, and Defect Detection

H. Thomas Yu, Zhongqing Jia, Chen Guan, Zhaohui Yu, Xiaolong Ma, Xiangshuai Wang, Xiangshuai Wang, Bing Zhao, X. Wang, X. Wang

原始摘要(英文原文)· Original abstract
With increasing quality demands in pharmaceutical and cosmetic packaging, this work presents a unified inspection platform for transparent ampoules that synergistically integrates stress measurement, dimensional measurement, and surface defect detection. Key innovations include an integrated system architecture, a shared-resource task scheduling mechanism, and an optimized deployment strategy tailored for production-like conditions. Non-contact residual stress measurement is achieved using the photoelastic method, while telecentric imaging combined with subpixel contour extraction enables accurate dimensional assessment. A YOLOv8-based deep learning model efficiently identifies multiple surface defect types, enhancing detection performance without increasing hardware complexity. Experimental validation under laboratory conditions simulating production lines demonstrates a stress measurement error of ±3 nm, dimensional accuracy of ±0.2 mm, and defect detection mAP@0.5 of 90.3%. The platform meets industrial inspection requirements and shows strong scalability and engineering potential. Future work will focus on real-time operation and exploring stress-defect coupling for intelligent quality prediction.
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A Multi-Parameter Inspection Platform for Transparent Packaging Containers: System Design for Stress, Dimensional, and Defect Detection — 科研速览 Science Skim