Vis–NIR–SWIR leaf reflectance spectra of 82 tea cultivars

This dataset contains 1,640 leaf-level mean Vis–NIR–SWIR reflectance spectra collected from 82 tea cultivars, with 20 independent plant-level samples per cultivar and 2,151 wavelength variables spanning approximately 350–2500 nm. Each spectrum represents the average of ten adaxial within-leaf measurements collected from one attached leaf on one independent tea plant.