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◆ Journal of the Optical Society of America A2026-04-21· Materials science

Speckle-illumination averaged wide-field reflection phase microscopy

Athira T.S, Pramod Panchal, Rakesh Singh, Dinesh Naik

原始摘要(英文原文)· Original abstract
An experimental scheme solely employing scalar optics to achieve speckle-illumination averaged wide-field reflection phase microscopy is proposed. The experimental setup utilizes a Sagnac-Linnik Michelson interferometer design, providing greater stability compared to conventional setups. The 3-D/phase imaging of the sample is achieved with reduced speckle noise, wider field of view, and improved resolution.
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Speckle-illumination averaged wide-field reflection phase microscopy — 科研速览 Science Skim