Generational Patterns in Work Engagement, Work Ability, Job Satisfaction and Turnover Intentions Among Nurses: A Cross-Sectional Study.

AIM: To examine generational patterns in work engagement, work ability, job satisfaction and internal and external turnover intentions among nurses in a hospital and community healthcare setting, and to examine whether those patterns persist after controlling for sociodemographic and occupational variables. DESIGN: Cross-sectional. METHODS: The study was conducted from October to December 2024. A total of 771 nurses completed a survey including the nine-item Utrecht Work Engagement Scale (UWES-9), the work ability index (WAI) and single-item measures assessing job satisfaction and turnover intentions. One-way ANOVA, chi-square tests and GLM univariate multivariable analyses with Bonferroni-corrected pairwise comparisons were conducted. RESULTS: Nurses reported high levels of work engagement and job satisfaction, with no statistically significant differences in the overall work engagement score across generations. Unadjusted analyses indicated significant generational differences in WAI scores, UWES 'absorption' and internal turnover intention. However, after controlling for confounders, these differences were no longer statistically significant. A significant adjusted generational effect emerged for 'vigour', with generation X scoring significantly higher than Millennials. CONCLUSION: This study contributes to expanding knowledge of how nurses' work engagement, work ability, job satisfaction and turnover intentions vary across generations. However, generational differences should be considered with caution as they may be affected by experiential variables. On the other hand, the adjusted effect on 'vigour' suggests that motivational resources differ across generations, with implications for strategies to sustain younger nurses' engagement and retention. PATIENT OR PUBLIC CONTRIBUTION: No patient or public contribution. REPORTING METHOD: STROBE guidelines for cross-sectional studies.