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◆ Research in Mathematics2026-02-05· Reliability (semiconductor)

A novel group acceptance sampling plan for the inverted Nadarajah-Haghighi distribution: An applications to quality control and reliability

Muhammad Ameeq, Laraib Fatima, Sidra Naz, Muhammad Muneeb Hassan, Basem A. Alkhaleel, Alpha Kargbo

原始摘要(英文原文)· Original abstract
In this study, we present a group acceptance sampling plan (GASP) in which the lifetime of an item follows the inverted Nadarajah Haghighi (INH) distribution. The percentile ratios were used as a quality indices for various constrained design parameters, including consumer risk, test termination, and the minimum required group g for the acceptance number c. We present the operating characteristic function values both graphically and in tabular form. We also determined useful expansions for the INH distribution and calculated several statistical and computational features of it. We also compared GASP and an ordinary sampling plan (OSP) and explained the findings using two real-life datasets with and example. However, our findings reveal that as the percentile ratio increases, g and c decrease in the INH model, and the upper percentile ratio performs better than the lower percentile ratio.
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