Taimin Miao, Yu Xu, Bo Liang, Wenpei Zhu, Neng Cai, Mingkai Xu, Di Wu, Hongze Gu, Wenjin Mao, Shenjin Zhang, Fengfeng Zhang, Feng Yang, Zhimin Wang, Qinjun Peng, Zuyan Xu, Zhihai Zhu, Xintong Li, Hanqing Mao, Lin Zhao, Guodong Liu, X. J. Zhou
Angle-resolved photoemission spectroscopy (ARPES) directly probes the energy and momentum of electrons in quantum materials, but conventional setups capture only a small fraction of the full 2π solid angle. This limitation is acute in laser-based ARPES, where the low photon energy restricts momentum space despite ultrahigh resolution. Here, we present systematic studies of bias ARPES, where applying a sample bias expands the accessible momentum range and enables full 2π solid angle collection in two dimension using our 6.994 eV laser source. An analytical conversion relation is established and validated to accurately map the detector angle to the emission angle and the electron momentum in two dimensions. A precise approach is developed to determine the sample work function, which is critical in the angle-momentum conversion of the bias ARPES experiments. Energy and angular resolutions are preserved under biases of up to 100 V, and minimizing beam size is shown to be crucial. The technique is effective both near normal and off-normal geometries, allowing flexible Brillouin zone access with lower biases. Bias ARPES thus elevates laser ARPES to a new level, extending momentum coverage while retaining high resolution and is applicable across a broad photon-energy range.