Gharam A. Alharshan, Shimaa Ali Said, A. A. Demewez, Saleh Alfarraj, Mika Sillanpää, Nasra M. Ebrahem
The purpose of this work is to examine how the insertion of cerium oxide (CeO 2 ) impacts the borosilicate glass system’s structure, dielectric, as well as radiation attenuation characteristics. As the CeO 2 quantities expand from 0.0 to 1.0 mol%, the glass’s density gradually rises between 2.9517 and 3.1526 g.cm − 3 . Additionally, the structural ordering process surrounding the SiO 4 within a glass structure is formed, and the proportion of linked boron (trigonal as well as tetrahedral cations) increases. As CeO 2 concentrations increase, the absolute value of a dielectric constant (ε’) decreases. Ce-1.0, the sample with the highest Cerium content, has a small ε’ in comparison to other Cerium contents, making it excellent for packing materials because of its fast travel speed. The Phy-X program was used examine, G Zeq , G EBF , G EABF , G Cef , G TF , and G RPE for five specimens of glass with different CeO 2 concentrations across a wide energy range (30–2000 keV). Ce-1.0 was found to have the highest G Zeq and the lowest G EBF and G EABF values. It was confirmed that raising the CeO 2 content improved the glass’s defense against nuclear radiation because there are more high Z numbers (Ce-58) which raises the chance of gamma-ray attenuation.