Seung Gyo Jeong, B. N. Lin, Mengru Jin, In Hyeok Choi, Seungjun Lee, Zhifei Yang, Sreejith Nair, Rashmi Choudhary, Juhi Parikh, Anand Santhosh, Matthew Neurock, Kelsey A. Stoerzinger, Jong Woo Lee, Tony Low, Qing Yun Tu, James M. LeBeau, Bharat Jalan
Interfacial polarization – charge accumulation at the heterointerface – is a well-established tool in semiconductors, but its influence in metals remains unexplored. Here, we demonstrate that interfacial polarization can robustly modulate surface work function in metallic rutile RuO2 layers in epitaxial RuO2/TiO2 heterostructures grown by hybrid molecular beam epitaxy. Using multislice electron ptychography, we directly visualize polar displacements of transition metal ions relative to oxygen octahedra near the interface, despite the conductive nature of RuO2. This interfacial polarization enables over 1 eV modulation of the RuO2 work function, controlled by small thickness variations (2-3 nm), as measured by Kelvin probe force microscopy, with a critical thickness of ~4 nm – corresponding to the transition from fully-strained to relaxed film. These results establish interfacial polarization as a powerful route to control electronic properties in metals and have implications for designing tunable electronic, catalytic, and quantum devices through interfacial control in polar metallic systems. This study shows that strain-stabilized interfacial polarization in metallic RuO2/TiO2 heterostructures modulates the work function by over 1 eV and the metallicity, establishing a new route to control the electronic properties of functional metals.