Nick Feldman, Arie J. den Boef, Lyubov V. Amitonova, A. Femius Koenderink
Fano resonances in nanophotonic structures are attractive for sensing due to their ultanarrow resonant linewidths and high local fields. Conventional read out schemes rely on measuring a frequency shift in Fano scattering spectra as function of perturbation. We experimentally demonstrate that angle-resolved analysis of the scattering of a Fano resonant structure is quantitatively more informative than measuring spectral shifts. We theoretically discuss how a perturbation affects fundamental nanophotonic properties of a Fano resonant metasystem, and how these are transduced to an observable far field response. We perform a rigorous experimental study in which we characterize deeply subwavelength perturbations in a Fano resonant dielectric metasurface using a conventional spectral approach, and a Fourier scatterometry based approach, and show that perturbations can lead to marked directional scattering in Fourier space. We finally quantitatively compare these two sensing methods in terms of their inherent Fisher information content, and show that an information advantage is obtained when the signal is resolved in Fourier space.