Zhang Xiaolong, Suo Hongli, Zhang Zili, Benzhe Zhou, Kausar Shaheen, Ji Yaotang, Ma Lin, Wang Lei, Qiuliang Wang
Degradation of critical current ( I c ) for ReBa 2 Cu 3 O 7-x (ReBCO) superconductor tape under tensile stress is extremely crucial for the stability of magnets in general and fusion magnets in specific at elevated fields such as (20T). Extensive research is carried out on the effect of tensile stress on I c values, considering the ReBCO tape with multiple nanocomposite layers as a homogeneous entity, while neglecting the interface between the layers. Herein this piece of work, for the very first time, the interface between ReBCO/CeO 2 nanocomposite is investigated in detail under varying tensile stress. In-situ EBSD technology was followed to systematically examine the crystal orientation rotation within CeO 2 nanofilms. Furthermore, a theoretical analysis for lattice-mismatch stress within ReBCO layer transmitted through ReBCO/CeO 2 interface is also provided. I c degradation due to ReBCO/CeO 2 interface is calculated, and the relevant stress under realistic magnetic conditions was evaluated by utilizing a multi-physics simulation technique. This work provides a novel approach for in-depth investigation of the I c degradation mechanism in ReBCO tape subjected to varying stress.