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◆ Journal of Materiomics2026-04-03· Materials science

Defect-engineered internal bias field enables highly efficient strain enhancement in lead-free BF-BT ferroelectric ceramics

Zhanpeng Li, Yangda Dong, Qihang Tang, Ting Zheng, Jiagang Wu

原始摘要(英文原文)· Original abstract
Defect engineering has been widely explored as an effective route to modulate the electromechanical response of piezoelectric ceramics. However, achieving a high strain gain per defect design is often constrained by the competition between bias enhancement and defect-induced pinning. Here, we systematically investigate the defect-mediated electromechanical behavior of Mn-doped BiFeO 3 –BaTiO 3 -based ceramics with controlled defect concentrations. It is demonstrated that introducing an appropriate level of B-site aliovalent Mn dopants effectively amplifies the internal bias field while preserving ferroelectric switch ability leading to a pronounced bias-assisted strain amplification. In the optimal composition ( x = 0.005), the strain increases from 0.02% to 0.23% at 3 kV/mm and from 0.06% to 0.36% at 4 kV/mm, corresponding to ∼1050% and ∼500% enhancements, respectively and a high large-signal piezoelectric coefficient d 33 * ≈ 900 pm/V. Structural and electrical analyses reveal that low Mn doping promotes the formation of dense nanodomains and facilitates the aging-induced ordering of defect dipoles, whereas excessive Mn incorporation induces strong lattice disorder and defect pinning, suppressing bias-field formation and strain response. These findings establish an effective defect–structure–bias-field design principle for enhancing electromechanical strain and strain-amplification efficiency in lead-free ferroelectric ceramics. • Novelty of this work: Combining defect engineering with internal bias-field modulation enhances electromechanical strain in BF-BT ceramics; • Defect-chemistry reveals excessive doping degrades strain via altered compensation, lattice disorder and pinning that suppress bias formation; • A physical model links defect concentration to bias evolution, explaining optimal defect window for strain enhancement.
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Defect-engineered internal bias field enables highly efficient strain enhancement in lead-free BF-BT ferroelectric ceramics — 科研速览 Science Skim