A Five‐Crystal Wavelength‐Dispersive X‐Ray Spectrometer

ABSTRACT This study presents a five‐crystal von‐Hamos‐type X‐ray spectrometer at the Shanghai Synchrotron Radiation Facility, which offers capabilities for X‐ray emission spectroscopy, resonant inelastic X‐ray scattering, and high‐energy resolution fluorescence‐detected X‐ray absorption near‐edge structure spectroscopy. With precise adjustments of crystal orientation and position, the dispersion spots of the five crystals can be perfectly focused at a single point, ensuring high‐energy resolution (1.2 eV at 8017.5 eV) and a high solid angle (1.3 msr/eV). This design provides an advanced platform for testing dilute samples and emission lines with low transition probabilities. The considerable travel ranges for the crystals and detector allow the Bragg angle of the X‐ray spectrometer to cover a range from 60°–85°, making it suitable for measuring a vast majority of emission lines. By leveraging the innate advantages of the von‐Hamos‐type geometry alongside high‐flux X‐ray sources, this spectrometer system achieves time‐resolved detection capabilities from seconds to milliseconds, significantly enhancing real‐time monitoring of dynamic changes in local electronic structures.